Distinguished Lecturer Program: 2019 Call for Applications

Distinguished Lecturer Program: 2019 Call for Applications

The Instrumentation and Measurement (I&M) Society is currently accepting applications for new Distinguished Lecturers (DL) for the Distinguished Lecturer Program (DLP). The DLP provides I&M chapters and technical events around the world with talks by experts on topics of interest and importance to the I&M community. Our lecturers are among the most qualified experts in their field. More details on the DLP can be found here

DLP Evaluations are conducted in person each year at I2MTC. This year, I2MTC will be held May 20 – 23 in Auckland, New Zealand. Details on the Evaluation Meeting will be posted on the I&M website (http://www.ieee-ims.org/) and the I2MTC website (http://imtc.ieee-ims.org/) as they become available.

Suggested topics for DL presentations include (but are not limited to):

  • Laser/Optics (including Fiber Optic Sensing)
  • Measurement Precision, Sensitivity, and Noise
  • Measurement Fundamentals (accuracy, trueness, repeatability, resolution, etc.)
  • Calibration and Calibration Periodicity
  • DC Measurements
  • Biomedical Instrumentation and Measurements
  • Robotics/Automated Measurements
  • Nanotechnology in Instrumentation and Measurement
  • Big Data and Metrology
  • Measurement for Food Safety
  • State-of-the-Art of Traditional Measurements and Instrumentation (Digitizers, Voltmeters, Spectrum Analyzers, etc.).

To apply, submit a single PDF file that includes the following:

  • Title of Presentation
  • Presenter's name and affiliation
  • Abstract of the presentation topic (between 500 and 1000 words)
  • A biography of the presenter (limited to 150 words)


Applications will be accepted through 11:59pm (CST) on May 3rd, 2019. Proposal presentations selected for an evaluation slot must be must be no longer than 12 minutes and must be presented in person at I2MTC.

For questions or to submit your application, contact the DLP Chair, Kristen Donnell, at [email protected].